Cumulative Sum Control Chart for a Doubly Truncated Binomial Distribution

Document Type : Original Article

Authors

1 St. Anthony's College, Shillong, India

2 Dep. of Mathematics and Statistics Allahabad University, Allahabad, India

Abstract

The CUSUM control chart for a doubly truncated binomial distribution (DTBD) is developed by using the well known approach of Johnson and the parameters of the V-mask are computed. The average run length for the one sided CUSUM scheme for testing the proportion of defectives underlying the DTBD is also obtained and the effect of truncation on this characteristic is investigated

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